在進行參數試錯時,通常將可能的參數由小到大排列一個個進行測試,這樣的測試順序很多時候不太合理,因此寫了一個按二分法遍歷順序排列的算法,通常能更快的找到合適的參數。代碼如下:
/*************************************************
Function: // BinarySort
Description: // sort array according to the traversal sequence of dichotomy
Input: // srcArray
Output: // dstArray
*************************************************/
void BinarySort(vector<int> srcArray, vector<int>& dstArray)
{
int begin = 0, end = srcArray.size()-1;
int mid, tempBegin, tempEnd;
vector<Point> intervalList;
intervalList.push_back(Point(begin,end));
while(intervalList.size()>0)
{
begin = intervalList.front().x;
end = intervalList.front().y;
mid = (begin + end)/2;
dstArray.push_back(srcArray[mid]);
if(begin <= mid-1)
{
tempBegin = begin;
tempEnd = mid - 1;
intervalList.push_back(Point(tempBegin,tempEnd));
}
if(mid+1 <= end)
{
tempBegin = mid+1;
tempEnd = end;
intervalList.push_back(Point(tempBegin,tempEnd));
}
intervalList.erase(intervalList.begin());
}
}
例如:
輸入srcArray = [10](164,174,184,194,204,214,224,234,244,254)
輸出dstArray = [10](204,174,234,164,184,214,244,194,224,254)